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Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation atomic force microscopy is based o...

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Kaydedildi:
Detaylı Bibliyografya
Yayımlandı:Sensors (Basel)
Asıl Yazarlar: Dagdeviren, Omur E., Miyahara, Yoichi, Mascaro, Aaron, Enright, Tyler, Grütter, Peter
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: MDPI 2019
Konular:
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC6832880/
https://ncbi.nlm.nih.gov/pubmed/31627343
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s19204510
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