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Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation atomic force microscopy is based o...
Kaydedildi:
| Yayımlandı: | Sensors (Basel) |
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| Asıl Yazarlar: | , , , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
MDPI
2019
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| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6832880/ https://ncbi.nlm.nih.gov/pubmed/31627343 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s19204510 |
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