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DeepRes: a new deep-learning- and aspect-based local resolution method for electron-microscopy maps
In this article, a method is presented to estimate a new local quality measure for 3D cryoEM maps that adopts the form of a ‘local resolution’ type of information. The algorithm (DeepRes) is based on deep-learning 3D feature detection. DeepRes is fully automatic and parameter-free, and avoids the is...
Tallennettuna:
| Julkaisussa: | IUCrJ |
|---|---|
| Päätekijät: | , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
International Union of Crystallography
2019
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6830216/ https://ncbi.nlm.nih.gov/pubmed/31709061 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252519011692 |
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