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DeepRes: a new deep-learning- and aspect-based local resolution method for electron-microscopy maps
In this article, a method is presented to estimate a new local quality measure for 3D cryoEM maps that adopts the form of a ‘local resolution’ type of information. The algorithm (DeepRes) is based on deep-learning 3D feature detection. DeepRes is fully automatic and parameter-free, and avoids the is...
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| Udgivet i: | IUCrJ |
|---|---|
| Main Authors: | , , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
International Union of Crystallography
2019
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6830216/ https://ncbi.nlm.nih.gov/pubmed/31709061 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252519011692 |
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