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CryoEM at 100 keV: a demonstration and prospects
100 kV is investigated as the operating voltage for single-particle electron cryomicroscopy (cryoEM). Reducing the electron energy from the current standard of 300 or 200 keV offers both cost savings and potentially improved imaging. The latter follows from recent measurements of radiation damage to...
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| Gepubliceerd in: | IUCrJ |
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| Hoofdauteurs: | , , , , , , , , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
International Union of Crystallography
2019
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6830209/ https://ncbi.nlm.nih.gov/pubmed/31709064 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252519012612 |
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