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Microscopic charge fluctuations cause minimal contrast loss in cryoEM
The fluctuating granularity or “bee swarm” effect seen in highly defocussed transmission electron micrographs is caused by microscopic charge fluctuations in the specimen created by the illuminating beam. In the field of high-resolution single particle electron cryomicroscopy (cryoEM), there has bee...
Gespeichert in:
| Veröffentlicht in: | Ultramicroscopy |
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| Hauptverfasser: | , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Elsevier
2018
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5862660/ https://ncbi.nlm.nih.gov/pubmed/29413413 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2018.01.011 |
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