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Microscopic charge fluctuations cause minimal contrast loss in cryoEM

The fluctuating granularity or “bee swarm” effect seen in highly defocussed transmission electron micrographs is caused by microscopic charge fluctuations in the specimen created by the illuminating beam. In the field of high-resolution single particle electron cryomicroscopy (cryoEM), there has bee...

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Bibliografiske detaljer
Udgivet i:Ultramicroscopy
Main Authors: Russo, Christopher J., Henderson, Richard
Format: Artigo
Sprog:Inglês
Udgivet: Elsevier 2018
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC5862660/
https://ncbi.nlm.nih.gov/pubmed/29413413
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2018.01.011
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