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High-resolution cryo-EM using beam-image shift at 200 keV
Recent advances in single-particle cryo-electron microscopy (cryo-EM) data collection utilize beam-image shift to improve throughput. Despite implementation on 300 keV cryo-EM instruments, it remains unknown how well beam-image-shift data collection affects data quality on 200 keV instruments and th...
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| Publicat a: | IUCrJ |
|---|---|
| Autors principals: | , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7642776/ https://ncbi.nlm.nih.gov/pubmed/33209328 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252520013482 |
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