Mapping of Genetic Loci Conferring Resistance to Leaf Rust From Three Globally Resistant Durum Wheat Sources

Genetic resistance in the host plant is the most economical and environmentally friendly strategy for controlling wheat leaf rust, caused by Puccinia triticina Eriks. The durum wheat lines Gaza (Middle East), Arnacoris (France) and Saragolla (Italy) express high levels of resistance to the Mexican r...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:Front Plant Sci
Hlavní autoři: Kthiri, Dhouha, Loladze, Alexander, N’Diaye, Amidou, Nilsen, Kirby T., Walkowiak, Sean, Dreisigacker, Susanne, Ammar, Karim, Pozniak, Curtis J.
Médium: Artigo
Jazyk:Inglês
Vydáno: Frontiers Media S.A. 2019
Témata:
Plant Science
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC6792298/
https://ncbi.nlm.nih.gov/pubmed/31649708
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3389/fpls.2019.01247
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!

Podobné jednotky