Mapping of Genetic Loci Conferring Resistance to Leaf Rust From Three Globally Resistant Durum Wheat Sources

Genetic resistance in the host plant is the most economical and environmentally friendly strategy for controlling wheat leaf rust, caused by Puccinia triticina Eriks. The durum wheat lines Gaza (Middle East), Arnacoris (France) and Saragolla (Italy) express high levels of resistance to the Mexican r...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Front Plant Sci
Egile Nagusiak: Kthiri, Dhouha, Loladze, Alexander, N’Diaye, Amidou, Nilsen, Kirby T., Walkowiak, Sean, Dreisigacker, Susanne, Ammar, Karim, Pozniak, Curtis J.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Frontiers Media S.A. 2019
Gaiak:
Plant Science
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC6792298/
https://ncbi.nlm.nih.gov/pubmed/31649708
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3389/fpls.2019.01247
Etiketak: Etiketa erantsi
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Antzeko izenburuak