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Radiation Response of Negative Gate Biased SiC MOSFETs

Silicon carbide (SiC) metal-oxide-semiconductor field effect transistors (MOSFETs) are expected as power electronic devices for high radiative conditions, including nuclear plants and space. Radiation response of commercial-grade prototype SiC MOSFETs with applying the gate bias is of interest, in t...

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Detalhes bibliográficos
Publicado no:Materials (Basel)
Main Authors: Takeyama, Akinori, Makino, Takahiro, Okubo, Shuichi, Tanaka, Yuki, Yoshie, Toru, Hijikata, Yasuto, Ohshima, Takeshi
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2019
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6747762/
https://ncbi.nlm.nih.gov/pubmed/31461860
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma12172741
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