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Quantitative dual-energy micro-CT with a photon-counting detector for material science and non-destructive testing
The recent progress in photon-counting detector technology using high-Z semiconductor sensors provides new possibilities for spectral x-ray imaging. The benefits of the approach to extract spectral information directly from measurements in the projection domain are very advantageous for material sci...
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| Vydáno v: | PLoS One |
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| Hlavní autoři: | , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Public Library of Science
2019
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6636745/ https://ncbi.nlm.nih.gov/pubmed/31314812 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0219659 |
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