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Quantitative dual-energy micro-CT with a photon-counting detector for material science and non-destructive testing
The recent progress in photon-counting detector technology using high-Z semiconductor sensors provides new possibilities for spectral x-ray imaging. The benefits of the approach to extract spectral information directly from measurements in the projection domain are very advantageous for material sci...
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | PLoS One |
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| Κύριοι συγγραφείς: | , , , , , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
Public Library of Science
2019
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| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6636745/ https://ncbi.nlm.nih.gov/pubmed/31314812 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0219659 |
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