A carregar...

Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers

For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Publicado no:J Synchrotron Radiat
Main Authors: Heimann, Philip, Reid, Alexander, Feng, Yiping, Fritz, David
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2019
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6412172/
https://ncbi.nlm.nih.gov/pubmed/30855243
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577519001802
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!