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Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers
For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick–...
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| Yayımlandı: | J Synchrotron Radiat |
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| Asıl Yazarlar: | , , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
International Union of Crystallography
2019
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| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6412172/ https://ncbi.nlm.nih.gov/pubmed/30855243 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577519001802 |
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