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Remote Phonon Scattering in Two-Dimensional InSe FETs with High-κ Gate Stack

This work focuses on the effect of remote phonon arising from the substrate and high-κ gate dielectric on electron mobility in two-dimensional (2D) InSe field-effect transistors (FETs). The electrostatic characteristic under quantum confinement is derived by self-consistently solving the Poisson and...

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Detalhes bibliográficos
Publicado no:Micromachines (Basel)
Main Authors: Chang, Pengying, Liu, Xiaoyan, Liu, Fei, Du, Gang
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2018
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6316064/
https://ncbi.nlm.nih.gov/pubmed/30572574
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/mi9120674
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