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Remote Phonon Scattering in Two-Dimensional InSe FETs with High-κ Gate Stack
This work focuses on the effect of remote phonon arising from the substrate and high-κ gate dielectric on electron mobility in two-dimensional (2D) InSe field-effect transistors (FETs). The electrostatic characteristic under quantum confinement is derived by self-consistently solving the Poisson and...
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| Vydáno v: | Micromachines (Basel) |
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| Hlavní autoři: | , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI
2018
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6316064/ https://ncbi.nlm.nih.gov/pubmed/30572574 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/mi9120674 |
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