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Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode
In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to de...
שמור ב:
| הוצא לאור ב: | Nanomaterials (Basel) |
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| Main Authors: | , , , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
MDPI
2018
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6215228/ https://ncbi.nlm.nih.gov/pubmed/30304791 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano8100807 |
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