Slattery, A. D., Shearer, C. J., Shapter, J. G., Blanch, A. J., Quinton, J. S., & Gibson, C. T. (2018). Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode. Nanomaterials (Basel).
Styl cytowania ChicagoSlattery, Ashley D., Cameron J. Shearer, Joseph G. Shapter, Adam J. Blanch, Jamie S. Quinton, i Christopher T. Gibson. "Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode." Nanomaterials (Basel) 2018.
Styl cytowania MLASlattery, Ashley D., et al. "Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode." Nanomaterials (Basel) 2018.
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