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Solution Based Methods for the Fabrication of Carbon Nanotube Modified Atomic Force Microscopy Probes

High aspect ratio carbon nanotubes are ideal candidates to improve the resolution and lifetime of atomic force microscopy (AFM) probes. Here, we present simple methods for the preparation of carbon nanotube modified AFM probes utilising solvent evaporation or dielectrophoresis. Scanning electron mic...

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Detalles Bibliográficos
Publicado en:Nanomaterials (Basel)
Main Authors: Slattery, Ashley D., Shearer, Cameron J., Shapter, Joseph G., Quinton, Jamie S., Gibson, Christopher T.
Formato: Artigo
Idioma:Inglês
Publicado: MDPI 2017
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC5707563/
https://ncbi.nlm.nih.gov/pubmed/29068385
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano7110346
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