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Angular-momentum nanometrology in an ultrathin plasmonic topological insulator film
Complementary metal–oxide–semiconductor (CMOS) technology has provided a highly sensitive detection platform for high-resolution optical imaging, sensing and metrology. Although the detection of optical beams carrying angular momentum have been explored with nanophotonic methods, the metrology of op...
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| Publicat a: | Nat Commun |
|---|---|
| Autors principals: | , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Publishing Group UK
2018
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6200795/ https://ncbi.nlm.nih.gov/pubmed/30356063 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-018-06952-1 |
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