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Angular-momentum nanometrology in an ultrathin plasmonic topological insulator film

Complementary metal–oxide–semiconductor (CMOS) technology has provided a highly sensitive detection platform for high-resolution optical imaging, sensing and metrology. Although the detection of optical beams carrying angular momentum have been explored with nanophotonic methods, the metrology of op...

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Detalhes bibliográficos
Publicado no:Nat Commun
Main Authors: Yue, Zengji, Ren, Haoran, Wei, Shibiao, Lin, Jiao, Gu, Min
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2018
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6200795/
https://ncbi.nlm.nih.gov/pubmed/30356063
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-018-06952-1
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