ロード中...
Angular-momentum nanometrology in an ultrathin plasmonic topological insulator film
Complementary metal–oxide–semiconductor (CMOS) technology has provided a highly sensitive detection platform for high-resolution optical imaging, sensing and metrology. Although the detection of optical beams carrying angular momentum have been explored with nanophotonic methods, the metrology of op...
保存先:
| 出版年: | Nat Commun |
|---|---|
| 主要な著者: | , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group UK
2018
|
| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6200795/ https://ncbi.nlm.nih.gov/pubmed/30356063 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-018-06952-1 |
| タグ: |
タグ追加
タグなし, このレコードへの初めてのタグを付けませんか!
|