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Aberration correction considering curved sample surface shape for non-contact two-photon excitation microscopy with spatial light modulator
In this paper, excitation light wavefront modulation is performed considering the curved sample surface shape to demonstrate high-quality deep observation using two-photon excitation microscopy (TPM) with a dry objective lens. A large spherical aberration typically occurs when the refractive index (...
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| Yayımlandı: | Sci Rep |
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| Asıl Yazarlar: | , , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Nature Publishing Group UK
2018
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| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6018692/ https://ncbi.nlm.nih.gov/pubmed/29915203 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-27693-7 |
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