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Aberration correction considering curved sample surface shape for non-contact two-photon excitation microscopy with spatial light modulator

In this paper, excitation light wavefront modulation is performed considering the curved sample surface shape to demonstrate high-quality deep observation using two-photon excitation microscopy (TPM) with a dry objective lens. A large spherical aberration typically occurs when the refractive index (...

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Bibliografske podrobnosti
izdano v:Sci Rep
Main Authors: Matsumoto, Naoya, Konno, Alu, Inoue, Takashi, Okazaki, Shigetoshi
Format: Artigo
Jezik:Inglês
Izdano: Nature Publishing Group UK 2018
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC6018692/
https://ncbi.nlm.nih.gov/pubmed/29915203
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-018-27693-7
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