Matsumoto, N., Konno, A., Inoue, T., & Okazaki, S. (2018). Aberration correction considering curved sample surface shape for non-contact two-photon excitation microscopy with spatial light modulator. Sci Rep.
Citação norma ChicagoMatsumoto, Naoya, Alu Konno, Takashi Inoue, and Shigetoshi Okazaki. "Aberration Correction Considering Curved Sample Surface Shape for Non-contact Two-photon Excitation Microscopy With Spatial Light Modulator." Sci Rep 2018.
Citação norma MLAMatsumoto, Naoya, Alu Konno, Takashi Inoue, and Shigetoshi Okazaki. "Aberration Correction Considering Curved Sample Surface Shape for Non-contact Two-photon Excitation Microscopy With Spatial Light Modulator." Sci Rep 2018.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.