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Nanoscale Probing of Interaction in Atomically Thin Layered Materials
[Image: see text] We combine conductive atomic force microscopy (CAFM) and molecular dynamics (MD) simulations to reveal the interaction of atomically thin layered materials (ATLMs) down to nanoscale lateral dimension. The setup also allows quantifying, for the first time, the effect of layer number...
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| 出版年: | ACS Cent Sci |
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| 主要な著者: | , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
American Chemical Society
2018
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| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5833011/ https://ncbi.nlm.nih.gov/pubmed/29532029 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acscentsci.7b00590 |
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