Načítá se...
Nanoscale Probing of Interaction in Atomically Thin Layered Materials
[Image: see text] We combine conductive atomic force microscopy (CAFM) and molecular dynamics (MD) simulations to reveal the interaction of atomically thin layered materials (ATLMs) down to nanoscale lateral dimension. The setup also allows quantifying, for the first time, the effect of layer number...
Uloženo v:
| Vydáno v: | ACS Cent Sci |
|---|---|
| Hlavní autoři: | , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
American Chemical Society
2018
|
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5833011/ https://ncbi.nlm.nih.gov/pubmed/29532029 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acscentsci.7b00590 |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!
|