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Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films
We have designed and developed a combined system of pulsed laser deposition (PLD) and non-contact atomic force microscopy (NC-AFM) for observations of insulator metal oxide surfaces. With this system, the long-period iterations of sputtering and annealing used in conventional methods for preparing a...
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| Publicado no: | Beilstein J Nanotechnol |
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| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5827635/ https://ncbi.nlm.nih.gov/pubmed/29527442 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.63 |
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