The electron-phonon interaction at deep Bi(2)Te(3)-semiconductor interfaces from Brillouin light scattering

It is shown that the electron-phonon interaction at a conducting interface between a topological insulator thin film and a semiconductor substrate can be directly probed by means of high-resolution Brillouin light scattering (BLS). The observation of Kohn anomalies in the surface phonon dispersion c...

Descripció completa

Guardat en:
Dades bibliogràfiques
Publicat a:Sci Rep
Autors principals: Wiesner, M., Trzaskowska, A., Mroz, B., Charpentier, S., Wang, S., Song, Y., Lombardi, F., Lucignano, P., Benedek, G., Campi, D., Bernasconi, M., Guinea, F., Tagliacozzo, A.
Format: Artigo
Idioma:Inglês
Publicat: Nature Publishing Group UK 2017
Matèries:
Article
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC5703879/
https://ncbi.nlm.nih.gov/pubmed/29180657
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-16313-5
Etiquetes: Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!

Ítems similars