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The electron-phonon interaction at deep Bi(2)Te(3)-semiconductor interfaces from Brillouin light scattering
It is shown that the electron-phonon interaction at a conducting interface between a topological insulator thin film and a semiconductor substrate can be directly probed by means of high-resolution Brillouin light scattering (BLS). The observation of Kohn anomalies in the surface phonon dispersion c...
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| Vydáno v: | Sci Rep |
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| Hlavní autoři: | , , , , , , , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Nature Publishing Group UK
2017
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5703879/ https://ncbi.nlm.nih.gov/pubmed/29180657 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-16313-5 |
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