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Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level

Single cell imaging mass spectrometry opens up a complete new perspective for strategies in toxicological risk assessment and drug discovery. In particular, time-of-flight secondary ion mass spectrometry (ToF-SIMS) with its high spatial and depth resolution is becoming part of the imaging mass spect...

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Detalhes bibliográficos
Publicado no:Toxics
Main Authors: Jungnickel, Harald, Laux, Peter, Luch, Andreas
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2016
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5606633/
https://ncbi.nlm.nih.gov/pubmed/29051411
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/toxics4010005
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