Cita APA

Jungnickel, H., Laux, P., & Luch, A. (2016). Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level. Toxics.

Chicago Style Citation

Jungnickel, Harald, Peter Laux, i Andreas Luch. "Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects On Single Cell Level." Toxics 2016.

Cita MLA

Jungnickel, Harald, Peter Laux, i Andreas Luch. "Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects On Single Cell Level." Toxics 2016.