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Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging

Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical technique rapidly expanding in use in biological studies. This technique is based on high spatial resolution (50–100 nm), high surface sensitivity (1–2 nm top-layer), and statistical analytic power. In mass spectromet...

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Bibliografiske detaljer
Udgivet i:Nano Converg
Main Authors: Yoon, Sohee, Lee, Tae Geol
Format: Artigo
Sprog:Inglês
Udgivet: Springer Singapore 2018
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC6153193/
https://ncbi.nlm.nih.gov/pubmed/30467706
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40580-018-0157-y
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