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Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging

Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical technique rapidly expanding in use in biological studies. This technique is based on high spatial resolution (50–100 nm), high surface sensitivity (1–2 nm top-layer), and statistical analytic power. In mass spectromet...

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Detalhes bibliográficos
Publicado no:Nano Converg
Main Authors: Yoon, Sohee, Lee, Tae Geol
Formato: Artigo
Idioma:Inglês
Publicado em: Springer Singapore 2018
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6153193/
https://ncbi.nlm.nih.gov/pubmed/30467706
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40580-018-0157-y
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