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Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging

Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical technique rapidly expanding in use in biological studies. This technique is based on high spatial resolution (50–100 nm), high surface sensitivity (1–2 nm top-layer), and statistical analytic power. In mass spectromet...

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Bibliografski detalji
Izdano u:Nano Converg
Glavni autori: Yoon, Sohee, Lee, Tae Geol
Format: Artigo
Jezik:Inglês
Izdano: Springer Singapore 2018
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC6153193/
https://ncbi.nlm.nih.gov/pubmed/30467706
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40580-018-0157-y
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