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Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffraction
This article presents the results of research on multi-layered heterostructures by a modified calculation technique of multiple X-ray diffraction. The Al(x)In(1−x)Sb heterostructure and a Zn(Mn)Se/GaAs(001) multi-layered system were used as models to specify conditions for cases of coincidental copl...
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| Izdano u: | J Appl Crystallogr |
|---|---|
| Glavni autori: | , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
International Union of Crystallography
2017
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| Teme: | |
| Online pristup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5458591/ https://ncbi.nlm.nih.gov/pubmed/28656037 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576717006574 |
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