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Soft X-ray Exposure Promotes Na Intercalation in Graphene Grown on Si-Face SiC
An investigation of how electron/photon beam exposures affect the intercalation rate of Na deposited on graphene prepared on Si-face SiC is presented. Focused radiation from a storage ring is used for soft X-ray exposures while the electron beam in a low energy electron microscope is utilized for el...
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| Vydáno v: | Materials (Basel) |
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| Hlavní autoři: | , , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI
2015
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5455511/ https://ncbi.nlm.nih.gov/pubmed/28793470 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma8084768 |
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