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Dislocation Energetics and Pop-Ins in AlN Thin Films by Berkovich Nanoindentation

Nanoindentation-induced multiple pop-ins were observed in the load-displacement curves when the mechanical responses of AlN films grown on c-plane sapphire substrates were investigated by using Berkovich indenters. No evidence of phase transformation is revealed by cross-sectional transmission elect...

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Bibliographic Details
Published in:Materials (Basel)
Main Authors: Jian, Sheng-Rui, Tseng, Yu-Chin, Teng, I-Ju, Juang, Jenh-Yih
Format: Artigo
Language:Inglês
Published: MDPI 2013
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Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC5452654/
https://ncbi.nlm.nih.gov/pubmed/28788330
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma6094259
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