Nanoindentation of GaSe thin films

The structural and nanomechanical properties of GaSe thin films were investigated by means of X-ray diffraction (XRD) and nanoindentation techniques. The GaSe thin films were deposited on Si(111) substrates by pulsed laser deposition. XRD patterns reveal only the pure (000 l)-oriented reflections or...

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Библиографические подробности
Главные авторы: Jian, Sheng-Rui, Ku, Shin-An, Luo, Chih-Wei, Juang, Jenh-Yih
Формат: Artigo
Язык:Inglês
Опубликовано: Springer 2012
Предметы:
Nano Express
Online-ссылка:https://ncbi.nlm.nih.gov/pmc/articles/PMC4113972/
https://ncbi.nlm.nih.gov/pubmed/22804961
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-403
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