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Nanoindentation of GaSe thin films
The structural and nanomechanical properties of GaSe thin films were investigated by means of X-ray diffraction (XRD) and nanoindentation techniques. The GaSe thin films were deposited on Si(111) substrates by pulsed laser deposition. XRD patterns reveal only the pure (000 l)-oriented reflections or...
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| Hlavní autoři: | , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer
2012
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4113972/ https://ncbi.nlm.nih.gov/pubmed/22804961 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-403 |
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