Carregando...
Dislocation-pipe diffusion in nitride superlattices observed in direct atomic resolution
Device failure from diffusion short circuits in microelectronic components occurs via thermally induced migration of atoms along high-diffusivity paths: dislocations, grain boundaries, and free surfaces. Even well-annealed single-grain metallic films contain dislocation densities of about 10(14) m(−...
Na minha lista:
| Publicado no: | Sci Rep |
|---|---|
| Principais autores: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2017
|
| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5382674/ https://ncbi.nlm.nih.gov/pubmed/28382949 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep46092 |
| Tags: |
Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!
|