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Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranes
Silicon nitride membranes can be used for windows of environmental chambers for in situ electron microscopy. We report that aberration corrected scanning transmission electron microscopy (STEM) achieved atomic resolution on gold nanoparticles placed on both sides of a 50-nm-thick silicon nitride mem...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
American Institute of Physics
2011
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3064681/ https://ncbi.nlm.nih.gov/pubmed/21448256 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.3561758 |
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