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Symmetric curvature descriptors for label-free analysis of DNA
High-resolution microscopy techniques such as electron microscopy, scanning tunnelling microscopy and atomic force microscopy represent well-established, powerful tools for the structural characterization of adsorbed DNA molecules at the nanoscale. Notably, the analysis of DNA contours allows mappin...
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| Publicat a: | Sci Rep |
|---|---|
| Autors principals: | , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Publishing Group
2014
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5377314/ https://ncbi.nlm.nih.gov/pubmed/25248631 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep06459 |
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