Loading...
Label-free, atomic force microscopy-based mapping of DNA intrinsic curvature for the nanoscale comparative analysis of bent duplexes
We propose a method for the characterization of the local intrinsic curvature of adsorbed DNA molecules. It relies on a novel statistical chain descriptor, namely the ensemble averaged product of curvatures for two nanosized segments, symmetrically placed on the contour of atomic force microscopy im...
Na minha lista:
| Main Authors: | , , , , |
|---|---|
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Oxford University Press
2012
|
| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3367213/ https://ncbi.nlm.nih.gov/pubmed/22402493 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/nar/gks210 |
| Tags: |
Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!
|