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Symmetric curvature descriptors for label-free analysis of DNA
High-resolution microscopy techniques such as electron microscopy, scanning tunnelling microscopy and atomic force microscopy represent well-established, powerful tools for the structural characterization of adsorbed DNA molecules at the nanoscale. Notably, the analysis of DNA contours allows mappin...
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| Gepubliceerd in: | Sci Rep |
|---|---|
| Hoofdauteurs: | , , , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Nature Publishing Group
2014
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5377314/ https://ncbi.nlm.nih.gov/pubmed/25248631 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep06459 |
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