Assessment of Microcrystal Quality by Transmission Electron Microscopy for Efficient Serial Femtosecond Crystallography

Serial femtosecond crystallography (SFX) employing high-intensity X-ray free-electron laser (XFEL) sources has enabled structural studies on microcrystalline protein samples at non-cryogenic temperatures. However, the identification and optimization of conditions that produce well diffracting microc...

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Detalhes bibliográficos
Publicado no:Arch Biochem Biophys
Main Authors: Barnes, Christopher O., Kovaleva, Elena G., Fu, Xiaofeng, Stevenson, Hilary P., Brewster, Aaron S., DePonte, Daniel P., Baxter, Elizabeth L., Cohen, Aina E., Calero, Guillermo
Formato: Artigo
Idioma:Inglês
Publicado em: 2016
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Article
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5215478/
https://ncbi.nlm.nih.gov/pubmed/26944553
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.abb.2016.02.011
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