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The complementarity of serial femtosecond crystallography and MicroED for structure determination from microcrystals
In recent years, nano and microcrystals have emerged as a valuable source of high-resolution structural information owing to the invention of serial femtosecond crystallography (SFX) with X-ray free electron lasers and microcrystal electron diffraction (MicroED) using electron cryomicroscopes. Once...
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| Publicado no: | Curr Opin Struct Biol |
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| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6778504/ https://ncbi.nlm.nih.gov/pubmed/31345629 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.sbi.2019.06.004 |
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