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Materials characterisation by angle-resolved scanning transmission electron microscopy

Solid-state properties such as strain or chemical composition often leave characteristic fingerprints in the angular dependence of electron scattering. Scanning transmission electron microscopy (STEM) is dedicated to probe scattered intensity with atomic resolution, but it drastically lacks angular...

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書目詳細資料
發表在:Sci Rep
Main Authors: Müller-Caspary, Knut, Oppermann, Oliver, Grieb, Tim, Krause, Florian F., Rosenauer, Andreas, Schowalter, Marco, Mehrtens, Thorsten, Beyer, Andreas, Volz, Kerstin, Potapov, Pavel
格式: Artigo
語言:Inglês
出版: Nature Publishing Group 2016
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在線閱讀:https://ncbi.nlm.nih.gov/pmc/articles/PMC5111052/
https://ncbi.nlm.nih.gov/pubmed/27849001
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep37146
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