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Materials characterisation by angle-resolved scanning transmission electron microscopy
Solid-state properties such as strain or chemical composition often leave characteristic fingerprints in the angular dependence of electron scattering. Scanning transmission electron microscopy (STEM) is dedicated to probe scattered intensity with atomic resolution, but it drastically lacks angular...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2016
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5111052/ https://ncbi.nlm.nih.gov/pubmed/27849001 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep37146 |
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