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Optical reflectance of pyrheliometer absorption cavities: progress towards SI-traceable measurements of solar irradiance

We have accurately determined the absorptance of three pyrheliometer cavities at 532 nm by measuring the residual reflectance using an angle-resolved bidirectional reflectometer. Measurements were performed at normal incidence as a function of viewing angle and position on the cavity cone. By numeri...

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Bibliografski detalji
Izdano u:Appl Opt
Glavni autori: Patrick, Heather J., Germer, Thomas A., Zarobila, Clarence J., Cooksey, Catherine C., Yoon, Howard W.
Format: Artigo
Jezik:Inglês
Izdano: 2016
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Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC5109930/
https://ncbi.nlm.nih.gov/pubmed/27534478
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