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Optical reflectance of pyrheliometer absorption cavities: progress towards SI-traceable measurements of solar irradiance

We have accurately determined the absorptance of three pyrheliometer cavities at 532 nm by measuring the residual reflectance using an angle-resolved bidirectional reflectometer. Measurements were performed at normal incidence as a function of viewing angle and position on the cavity cone. By numeri...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Appl Opt
Egile Nagusiak: Patrick, Heather J., Germer, Thomas A., Zarobila, Clarence J., Cooksey, Catherine C., Yoon, Howard W.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: 2016
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC5109930/
https://ncbi.nlm.nih.gov/pubmed/27534478
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