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Optical reflectance of pyrheliometer absorption cavities: progress towards SI-traceable measurements of solar irradiance
We have accurately determined the absorptance of three pyrheliometer cavities at 532 nm by measuring the residual reflectance using an angle-resolved bidirectional reflectometer. Measurements were performed at normal incidence as a function of viewing angle and position on the cavity cone. By numeri...
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| Vydáno v: | Appl Opt |
|---|---|
| Hlavní autoři: | , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
2016
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5109930/ https://ncbi.nlm.nih.gov/pubmed/27534478 |
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