Yüklüyor......
Application of dynamic impedance spectroscopy to atomic force microscopy
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new co...
Kaydedildi:
| Yayımlandı: | Sci Technol Adv Mater |
|---|---|
| Asıl Yazarlar: | , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Taylor & Francis
2008
|
| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5099648/ https://ncbi.nlm.nih.gov/pubmed/27878034 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/9/4/045006 |
| Etiketler: |
Etiketle
Etiket eklenmemiş, İlk siz ekleyin!
|