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Application of dynamic impedance spectroscopy to atomic force microscopy
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new co...
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| 出版年: | Sci Technol Adv Mater |
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| 主要な著者: | , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Taylor & Francis
2008
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5099648/ https://ncbi.nlm.nih.gov/pubmed/27878034 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/9/4/045006 |
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