Wordt geladen...
Application of dynamic impedance spectroscopy to atomic force microscopy
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new co...
Bewaard in:
| Gepubliceerd in: | Sci Technol Adv Mater |
|---|---|
| Hoofdauteurs: | , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Taylor & Francis
2008
|
| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5099648/ https://ncbi.nlm.nih.gov/pubmed/27878034 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/1468-6996/9/4/045006 |
| Tags: |
Voeg label toe
Geen labels, Wees de eerste die dit record labelt!
|