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Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy
Atomic force microscopy (AFM) force-distance measurements are used to investigate the layered ion structure of Ionic Liquids (ILs) at the mica surface. The effects of various tip properties on the measured force profiles are examined and reveal that the measured ion position is independent of tip pr...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2016
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5009352/ https://ncbi.nlm.nih.gov/pubmed/27587276 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep32389 |
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