A carregar...
Measurement of the across-plane conductivity of YSZ thin films on silicon
Across-plane conductivity measurements on ion conducting thin films of a few ten nanometers thickness are challenging due to frequently occurring short-circuits through pinholes in the layer. In this contribution, a method is proposed which allowed across-plane conductivity measurements on yttria st...
Na minha lista:
| Publicado no: | Solid State Ion |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Elsevier Science B.V
2012
|
| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4986284/ https://ncbi.nlm.nih.gov/pubmed/27570328 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ssi.2012.01.007 |
| Tags: |
Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!
|