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Measurement of the across-plane conductivity of YSZ thin films on silicon
Across-plane conductivity measurements on ion conducting thin films of a few ten nanometers thickness are challenging due to frequently occurring short-circuits through pinholes in the layer. In this contribution, a method is proposed which allowed across-plane conductivity measurements on yttria st...
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| Pubblicato in: | Solid State Ion |
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| Autori principali: | , , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Elsevier Science B.V
2012
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4986284/ https://ncbi.nlm.nih.gov/pubmed/27570328 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ssi.2012.01.007 |
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